DT-NCLR datasheet
AFM Probe Type: DT-NCLR
Product Description:
For applications that require hard contact between tip and sample this sensor offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond. The typical macroscopic tip radius of curvature is between 100 and 200 nm. Nanoroughnesses in the 10 nm regime improve the resolution on flat surfaces.
The probe offers unique features:
- real diamond coating
- high mechanical Q-factor for high sensitivity
- precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage
of the alignment chip
- compatible with PointProbe® Plus XY-Alignment Series
This product features alignment grooves on the backside of the holder chip.
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Shape | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| beam | 225 µm(215 - 235 µm)* | 38 µm(30 - 45 µm)* | 7 µm(6 - 8 µm)* | 48 N/m(21 - 98 N/m)* | 190 kHz(146 - 236 kHz)* |
AFM Tips:
| Shape | Tip Radius |
|---|---|
| Standard | <200 nm guaranteed |
* guaranteed range
Coating:
Sensors Datasheets:
Datasheet for all AFM probes with sets of 10 or 20 probes.
Datasheet for up to 32 probes with full wafer.
Purchasing Info:
Product Availability: |
From stock |
Price Description: |
Does not include VAT or customs duties. |
Terms and Conditions for NANOSENSORS