CONTSCR datasheet
AFM Probe Type: CONTSCR
Product Description:
NanoWorld Pointprobe® CONTSCR AFM probe is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.
All SPM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.
Additionally this probe offers excellent tip radius of curvature.
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Shape | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| beam | 225 µm(220 - 230 µm)* | 48 µm(42.5 - 52.5 µm)* | 1 µm(0.5 - 1.5 µm)* | 0.2 N/m(0.02 - 0.7 N/m)* | 23 kHz(10 - 39 kHz)* |
AFM Tips:
| Shape | Tip Height | Tip Radius |
|---|---|---|
| Standard | 10 - 15 µm* | <8 nm( < 12 nm guaranteed ) |
* typical range
Coating:
The reflex coating on the detector side of the cantilever enhances its reflectivity and prevents light from interfering within the cantilever.
Purchasing Info:
Product Availability: |
From stock |
Price Description: |
Does not include VAT or customs duties. |
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