CDT-FMR datasheet
AFM Probe Type: CDT-FMR
Product Description:
NANOSENSORS™ CDT-FMR probes are designed for force modulation microscopy. The force constant of this probe type spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The FM sensor serves also as a basis for magnetic coatings (MFM). Furthermore non-contact or tapping mode operation is possible with the FM probe but with reduced operation stability.
For applications that require a wear resistant and an electrically conductive tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is slightly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.
The typical macroscopic tip radius of curvature is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces.
The probe offers unique features:
- real diamond coating, slightly doped
- high mechanical Q-factor for high sensitivity
- precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage
of the alignment chip
- compatible with PointProbe® Plus XY-Alignment Series
- real diamond coating, slightly doped
- high mechanical Q-factor for high sensitivity
- precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage
of the alignment chip
- compatible with PointProbe® Plus XY-Alignment Series
This product features alignment grooves on the backside of the holder chip.
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Shape | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| beam | 225 µm(215 - 235 µm)* | 28 µm(20 - 35 µm)* | 3 µm(2 - 4 µm)* | 2.8 N/m(0.5 - 9.5 N/m)* | 75 kHz(45 - 115 kHz)* |
AFM Tips:
| Shape | Tip Radius |
|---|---|
| Standard | <200 nm guaranteed |
* guaranteed range
Coating:
The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 3.5% of the cantilever length.
Sensors Datasheets:
Datasheet for all AFM probes with sets of 10 or 20 probes.
Datasheet for up to 32 probes with full wafer.
Purchasing Info:
Product Availability: |
From stock |
Price Description: |
Does not include VAT or customs duties. |
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