All-In-One-Al datasheet
AFM Probe Type:
All-In-One-Al
Product Description:
Versatile silicon AFM probe with 4 different cantilevers on a single AFM holder chip.
Rotated, monolithic silicon AFM probe for various applications (Contact Mode, Force Modulation Mode, Tapping Mode and Soft Tapping Mode);
Symmetric tip shape;
The AFM holder chip fits most commercial AFMs as it is industry standard size. It is compatible with DI/Veeco AFMs, TM Microscopes, JEOL, Molecular Imaging, and other commercial atomic force microscopes (AFMs).
The main advantage of this product compared to regular, single-cantilever AFM probes is the freedom to choose in the very last moment the right cantilever for each application. You don't need to stock various AFM Probe types any more. Nevertheless, this product is not meant as a substitution to comparable single-cantilever AFM probes, because the geometry of each one of the All-In-One cantilevers differs from the geometry of comparable specialized single-cantilever AFM probes.
BudgetSensors offers consistent high quality at a lower price!
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Cant. | Cant. Name | Shape | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|---|---|
| 1 | Tapping Mode | beam | 100 µm(90 - 110 µm)* | 50 µm(45 - 55 µm)* | 2.7 µm(1.7 - 3.7 µm)* | 40 N/m(7 - 160 N/m)* | 350 kHz(200 - 500 kHz)* |
| 2 | Soft Tapping | beam | 150 µm(140 - 160 µm)* | 30 µm(25 - 35 µm)* | 2.7 µm(1.7 - 3.7 µm)* | 7.4 N/m(1 - 29 N/m)* | 150 kHz(70 - 230 kHz)* |
| 3 | Force Modulation | beam | 210 µm(200 - 220 µm)* | 30 µm(25 - 35 µm)* | 2.7 µm(1.7 - 3.7 µm)* | 2.7 N/m(0.4 - 10 N/m)* | 80 kHz(50 - 110 kHz)* |
| 4 | Contact Mode | beam | 500 µm(490 - 510 µm)* | 30 µm(25 - 35 µm)* | 2.7 µm(1.7 - 3.7 µm)* | 0.2 N/m(0.04 - 0.7 N/m)* | 15 kHz(10 - 20 kHz)* |
AFM Tips:
| on Cant. | Shape | Tip Height | Tip Set Back | Tip Radius | Half Cone Angles |
|---|---|---|---|---|---|
| 1 (Tapping Mode) | Rotated | 17 µm(15 - 19 µm)* | 15 µm(10 - 20 µm)* | <10 nm | 20°-25° along cantilever axis; 25°-30° from side; 10° at the apex |
| 2 (Soft Tapping) | Rotated | 17 µm(15 - 19 µm)* | 15 µm(10 - 20 µm)* | <10 nm | 20°-25° along cantilever axis; 25°-30° from side; 10° at the apex |
| 3 (Force Modulation) | Rotated | 17 µm(15 - 19 µm)* | 15 µm(10 - 20 µm)* | <10 nm | 20°-25° along cantilever axis; 25°-30° from side; 10° at the apex |
| 4 (Contact Mode) | Rotated | 17 µm(15 - 19 µm)* | 15 µm(10 - 20 µm)* | <10 nm | 20°-25° along cantilever axis; 25°-30° from side; 10° at the apex |
* typical range
Coating:
Aluminium reflex coating on detector side of the cantilever, 30 nm thick
Sensors Datasheets:
No datasheet
Purchasing Info:
Product Availability: |
From stock |
Price Description: |
Does not include VAT or customs duties. |

