ARROW-NC datasheet
AFM Probe Type: ARROW-NC
Product Description:
NanoWorld Arrow™ NC probes are designed for non-contact or tapping™ mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability. All probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip. Additionally this probe offers an excellent tip radius of curvature.
The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Shape | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| beam | 160 µm(155 - 165 µm)* | 45 µm(40 - 50 µm)* | 4.6 µm(4.1 - 5.1 µm)* | 42 N/m(27 - 80 N/m)* | 285 kHz(240 - 380 kHz)* |
AFM Tips:
| Shape | Tip Height | Tip Radius |
|---|---|---|
| Arrow | 10 - 15 µm* | <10 nm |
* typical range
Coating:
None
Sensors Datasheets:
No datasheet
Purchasing Info:
Product Availability: |
From stock |
Price Description: |
Does not include VAT or customs duties. |
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