ARROW-FMR datasheet
AFM Probe Type: ARROW-FMR
Product Description:
NanoWorld Arrow™ FM probes are designed for Force Modulation Mode imaging. The Force Constant of the FM type fills the gap between Contact and Non-Contact probes. Furthermore Non-Contact / TappingMode™ imaging is possible with this AFM probe.
All probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip.
Additionally this probe offers an excellent tip radius of curvature.
The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Shape | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| beam | 240 µm(235 - 245 µm)* | 35 µm(30 - 40 µm)* | 3 µm(2.5 - 3.5 µm)* | 2.8 N/m(1.4 - 5.8 N/m)* | 75 kHz(58 - 97 kHz)* |
AFM Tips:
| Shape | Tip Height | Tip Radius |
|---|---|---|
| Arrow | 10 - 15 µm* | <10 nm |
* typical range
Coating:
The reflex coating on the detector side of the cantilever enhances its reflectivity and prevents light from interfering within the cantilever.
Sensors Datasheets:
No datasheet
Purchasing Info:
Product Availability: |
From stock |
Price Description: |
Does not include VAT or customs duties. |
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